News and Information
The following two major instruments have been installed in the CharFac's Shepherd Labs basement facility. Interested parties should contact the staff scientists managing the instruments to discuss capabilities. (Click on Staff link for contact information.)
|(1) A new Phi VersaProbe III X-ray/ultraviolet photoelectron spectrometer (XPS/UPS) has been installed in CharFac's surface-analytical area, managed by Drs. Bing Luo and Geoff Rojas. This system is a radical improvement in both spatial and energy resolution (the latter for chemical state analysis), angle-resolved measurements and sensitivity. It adds the fundamentally new capabilities of UPS and cluster-ion beam sputtering (for compositional depth profiles). UPS enables the probing of electronic valence states as well as shallow core energy levels. Cluster-ion sputtering is ideal for soft materials by minimizing the perturbation of chemistry, a serious issue with classic single-atom sputtering gases such as argon. More detailed information is available at the vendor web site: www.phi.com/surface-analysis-equipment/versaprobe.html||
The Phi VersaProbe III XPS/UPS in Charfac's central lab.
|(2) A new FEI Helios NanoLab G4 dual-beam focused ion beam (FIB) instrument has been installed in an available bay in the vibrationally isolated High Resolution Microscopy Center (HRMC), managed by Dr. Nick Seaton. The FIB provides fast, accurate, and precise milling and deposition of complex structures with critical dimensions of less than 10 nm. Its ultimate SEM imaging resolution approaches 0.6 nm. More detailed information is available at the vendor web site: www.fei.com/products/dualbeam/helios-nanolab||
The FEI Helios dual-beam FIB in CharFac's High Resolution Microscopy Center.