College of Science and Engineering Characterization Facility

Upcoming Events


For XPS users

Physical Electronics is organizing PHI User Meeting and Data Reduction Software Training has been scheduled for September 10-13, 2019 at the Country Inn & Suites Hotel in Chanhassen, MN! Visit the following link for further details.

https://www.phi.com/news/PHI-user-meeting-and-training-2019.html

For U of M Alumni and non-alumni: Become a Mentor

Sign up to share your professional insight with a CSE student.
The University of Minnesota College of Science and Engineering (CSE) Mentor Program aims to give our students insight and guidance into what comes after graduation by matching industry professionals with current CSE sophomores, juniors, and seniors. As a mentor working one-on-one with a student just a few hours per month, you will help your student prepare for the transition from college life to the workplace as well as build your own coaching, communication, and leadership skills. Register by Sept 20, 2019. More details at

https://cse.umn.edu/college/cse-mentor-program

News and Information




 

New equipment

The following two major instruments have been installed in the CharFac's Shepherd Labs basement facility. Interested parties should contact the staff scientists managing the instruments to discuss capabilities. (Click on Staff link for contact information.)

(1) A new Phi VersaProbe III X-ray/ultraviolet photoelectron spectrometer (XPS/UPS) has been installed in CharFac's surface-analytical area, managed by Drs. Bing Luo and Geoff Rojas. This system is a radical improvement in both spatial and energy resolution (the latter for chemical state analysis), angle-resolved measurements and sensitivity. It adds the fundamentally new capabilities of UPS and cluster-ion beam sputtering (for compositional depth profiles). UPS enables the probing of electronic valence states as well as shallow core energy levels. Cluster-ion sputtering is ideal for soft materials by minimizing the perturbation of chemistry, a serious issue with classic single-atom sputtering gases such as argon. More detailed information is available at the vendor web site: www.phi.com/surface-analysis-equipment/versaprobe.html Photo of Phi VersaProbe III
The Phi VersaProbe III XPS/UPS in Charfac's central lab.

(2) A new FEI Helios NanoLab G4 dual-beam focused ion beam (FIB) instrument has been installed in an available bay in the vibrationally isolated High Resolution Microscopy Center (HRMC), managed by Dr. Nick Seaton. The FIB provides fast, accurate, and precise milling and deposition of complex structures with critical dimensions of less than 10 nm. Its ultimate SEM imaging resolution approaches 0.6 nm. More detailed information is available at the vendor web site: www.fei.com/products/dualbeam/helios-nanolab Photo of FEI Helios dual-beam FIB
The FEI Helios dual-beam FIB in CharFac's High Resolution Microscopy Center.

 

 

Main Office

12 Shepherd Labs
100 Union St. S.E.
Minneapolis, MN 55455

Phone:  (612) 626-7594
Fax:  (612) 625-5368
Email: