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Home > Instruments > Hitachi S‑4700

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Cold Field Emission Gun
Scanning Electron Microscope

Hitachi S-4700

Location:  1–226 Nils Hasselmo Hall

Contacts:  Chris Frethem
Hanseung Lee

Instruction manual   [  PDF 1.5MB]

SEM Primer   [  PDF 2.6MB]

SEM Training Policy   [  PDF 17.6kB]


  • High-resolution topographic contrast (Se) and atomic number contrast (BSe) imaging of biological and non-biological samples in both room temperature and cryo modes
  • Cold field-emission gun
  • Resolution: 1.5 nm at 15 kV, 12 mm W.D.; and 2.5 nm resolution at 1 k, 2.5 mm W.D.
  • Magnification ranges from 30X to 500,000X.
  • Two secondary electron detectors: one above the objective lens, the other below
  • Backscatter imaging at TV rates and low voltage (threshold 2.5 kV on gold) with Autrata modified YAG (yttrium aluminum garnet, cerium doped) crystal
  • Sample size up to 100 mm diameter x 17 mm high
  • Specimen tilt at 12 mm W.D up to 45 degrees.
  • Digital image acquisition at 640 X 480, 1280 X 960, or 1560 X 1920 pixels

An Emitech cryo stage is available for use with samples prepared in the Emitech K-1250 Cryopreparation / Cryotransfer

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