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Home > Instruments > JEOL 6700

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Field Emission Gun
Scanning Electron Microscope

JEOL 6700

Location:  76 Shepherd Labs

Contact:  Nicholas Seaton

Instruction manual   [  PDF 189kB]

SEM Primer   [  PDF 2.6MB]

SEM Training Policy   [  PDF 17.6kB]

Specifications:

  • High resolution secondary electron imaging with both lower and "in-lens" SE detectors
  • Cold field-emission gun
  • "In-lens" design.  Sample size limit of ~ 5 mm W X 10 mm L X 2.5 mm H
  • Accelerating voltage from 0.5 to 30 kV
  • Lateral resolution of 1nm
  • Magnification ranges from 10 X to 700,000X
  • Sample size: 50 x 125 x 125 mm

Sample Applications:

  • Examination of fracture surfaces
  • Examination and quantification of nano-scratch tests
  • Stereo-imaging of surfaces
  • Microstructure of surfactant systems
  • Measurement of the width of layers of magnetic read devices
  • Characterization of grain boundaries of ceramics

more info...