Location: 76 Shepherd Labs
Contact: Nicholas Seaton
Instruction manual [ PDF 189kB]
SEM Primer [ PDF 2.6MB]
SEM Training Policy [ PDF 17.6kB]
Specifications:
- High resolution secondary electron imaging with both lower and "in-lens" SE detectors
- Cold field-emission gun
- "In-lens" design. Sample size limit of ~ 5 mm W X 10 mm L X 2.5 mm H
- Accelerating voltage from 0.5 to 30 kV
- Lateral resolution of 1nm
- Magnification ranges from 10 X to 700,000X
- Sample size: 50 x 125 x 125 mm
Sample Applications:
- Examination of fracture surfaces
- Examination and quantification of nano-scratch tests
- Stereo-imaging of surfaces
- Microstructure of surfactant systems
- Measurement of the width of layers of magnetic read devices
- Characterization of grain boundaries of ceramics