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Greg Haugstad

Facility director: general technical topics, usage policies, staffing, strategic planning, budgetary, events

Facility services, scanning probe microscopy (SPM/AFM)

Facility services, ion beam analysis (IBA/RBS/PIXE/etc)

Principal/co-investigator, proposals, committee/panel service, course instructor/speaker, session chair/organizer, peer review



Education

Ph.D.  Physics (minor Materials Science), University of Minnesota
B.A.  Physics (minor Mathematics), Gustavus Adolphus College


Professional Experience

2001 - present Graduate faculty, Department of Chemical Engineering and Materials Science
2000 - present Senior staff scientist / principal investigator & director, Characterization Facility
1998 - 2000 Senior staff scientist / principal investigator, CIE Characterization Facility
1994 - 1998 Staff scientist / co-principal investigator, CIE Characterization Facility
1991 - 1994 Postdoctoral researcher, Dept. of Chemistry / CIE Thin Films group
1986 - 1991 Research and teaching assistant, Dept. of Chemical Engineering and Materials Science
1984 - 1986 Nationally competitive summer research fellowships, 3M Company and Ames Laboratory

Selected Publications

Research Description

Research Collaborations


Greg Haugstad is technical staff member and director of the Characterization Facility (CharFac), a core research facility at the University of Minnesota. The CharFac serves industry as well as internal and external academics by providing analytical services, training for hands-on use and methods development. The CharFac is part of the Materials Research Facilities Network (www.mrfn.org) via the NSF's MRSEC program, and has served an integral role in an industry-academic consortium (~40 companies, startups to transnationals) for 28 years, now known as IPRIME (Industrial Partnership for Research in Interfacial and Materials Engineering, www.iprime.umn.edu).

Greg is a condensed matter physicist with BA and Ph.D. degrees from Gustavus Adolphus College and the University of Minnesota, respectively. Prior to his Ph.D. work he had research fellowships at Ames Lab and 3M, the latter on nanocomposites for GHz-regime electromagnetic wave absorption ("stealth") using vector network analysis. His Ph.D. research focused on electronic properties at metal and semiconductor interfaces, employing in situ characterization (soft X-ray and ultraviolet photoelectron spectroscopy) at the synchrotron light source Aladdin near Madison, WI (adviser Alfonso Franciosi). After postdoctoral research with DuPont in a UMinn NSF Engineering Research Center (adviser Wayne Gladfelter), developing atomic force microscopy (AFM) methods to study interfaces in light-sensitive imaging media, he joined the CharFac in 1994; here he continued industry research collaborations as both principal investigator and hands-on researcher. He added managerial, teaching, service and developmental responsibilities for core labs in AFM as well as ion beam analysis (IBA), which includes Rutherford backscattering (RBS), particle-induced X-ray/gamma-ray emission (PIXE/PIGE) and other methods for elemental and depth-dependent composition and epitaxy. His AFM research program includes:

  1. Information content in diverse imaging and mapping modes, both laterally and vertically sensitive (e.g., data cube);
  2. Nanotribology, nanorheology and nanomechanics, including custom modulation methods, dependence on rate/temperature/humidity, and liquid immersion (e.g, colloid probe);
  3. Polymeric, organic and biological films and coatings, and microtomed complex materials;
  4. Polymer nanocomposites with nanoparticle, carbon nanotube (CNT), or 2D fillers, as well as CNT- or graphene-based device constructs.

Greg is a frequent speaker at conferences and workshops emphasizing nanoscale characterization. He has collaborated with industry on open research related to inkjet printing and micro/nano-spray coatings; adhesion/release media; personal care films; biomedical device surface modification; polymer-drug nanoparticles and coatings; ultrafiltration media; and nanocomposites. He further provides analytical services with a broad range of clients. Since 2001 he has served on the graduate faculty, providing a materials characterization emphasis. His teaching has included graduate courses in imaging, spectrometry and nanomechanics; undergraduate characterization labs; nanocharacterization capstone courses for 2-year students; training classes for the CharFac; and national-reach short courses. Spurred by this educational vantage point, and derived from both teaching materials and research data, Dr. Haugstad has written a methods monograph on AFM entitled: Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications (Wiley)