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Home > Instruments > Nanoscope V Multimode 8

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Scanning Probe Microscope

SPM1: Bruker Nanoscope V Multimode 8


Location:  87 Shepherd Labs

Contacts:  Greg Haugstad

SPM Overview and common instrument characteristics

Specifications:

  • Nikon optical microscope with CCD and image capture for tip positioning.
  • Nano-K Biscuit vibration isolation platform.
  • Hysitron-SPM combination enables nanoindentation, microscratch, and other mechanical tests along with in situ high-resolution imaging.
  • Maximum load is approximately 2 mN and force resolution is 100 nN with Hysitron tester.
  • Maximum scan size 150 x 150 µm laterally and 5.6 µm vertically.